Modules AD1 – AD6
Modules AD1 – AD6 are NAI’s latest generation Analog-to-Digital Modules. They provide a choice of the following conversion capabilities: multi-channel differential input or unipolar/bipolar voltage. Tailored to meet stringent test applications, these modules are used on our multifunction embedded I/O boards and SBCs.
Modules AD1 – AD3 feature 12 channels with up to 24-bit Sigma-Delta A/D converters for each individual channel. The maximum programmable, expected full-scale range input for the three modules is ±10 V, ±50 V, and ±100 V, respectively. These modules also can be programmed for direct current measurement mode, 0-25 mA, and the A/D converters have programmable sample rates of up to 200 kHz.
Modules AD4 – AD6 feature 16 channels with 16-bit Successive Approximation Register (SAR) A/D converters for each group of 8 channels (multiplexed). The maximum programmable, expected full-scale range input for the three modules is ±10 V, ±50 V, and ±100 V, respectively. The A/D converters have programmable sample rates of up to 500 Ksps max., aggregate, per bank of eight channels. Also, module AD4 can be programmed for direct current measurement mode, 0-25 mA.
For all module types, the input range and gain is also field-programmable for each channel. The ability to set lower expected, full-scale voltage gain ranges assures the use of the full resolution. Each channel includes a fixed, second order, anti-aliasing filter and a digital post filter with a programmable break point that enables users to field-adjust the filtering for each channel.
The extended A/D FIFO buffering capabilities of these modules supports greater storage/management of the incoming signal samples (data) for post-processing applications. Data samples can be stored in the buffer either at the maximum programmed base A/D sample rate or by an integer-divided sample rate. Programmable FIFO buffer thresholds maximize data flow control (movement in and out of the FIFO). Incremental relative time-stamping between samples also is provided as a programmable option.
All A/D channels are self-aligning and continuous Background Built-In-Test (BIT) status is provided for channel health and operation feedback. On a rotating basis, each channel is automatically trimmed/tested for optimal conversion and reliability to eliminate offset and gain errors throughout the entire operating envelope (temperature and drift control). Open inputs are sensed and flagged on modules AD1 and AD4, the lowest range function modules.